Bruker Corporation Optical Coordinate Measurement Machine (CMM)

Description
The world's first CMM that can provide surface roughness, shape, and size data ” all with one measurement technique. Bruker™s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional metrology and 3D surface analysis.   Contour CMM provides engineers and researchers the ability to perform simultaneous nanoscale height and surface texture, and 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument.  
  • Optical Coordinate Measurement Machine (CMM) - Bruker Corporation
    Bruker Corporation
Description
The world's first CMM that can provide surface roughness, shape, and size data ” all with one measurement technique. Bruker™s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional metrology and 3D surface analysis.   Contour CMM provides engineers and researchers the ability to perform simultaneous nanoscale height and surface texture, and 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument.  

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Optical Coordinate Measurement Machine (CMM) - - Bruker Corporation
Bruker Corporation
Billerica, MA, USA
Optical Coordinate Measurement Machine (CMM)
Optical Coordinate Measurement Machine (CMM)
The world's first CMM that can provide surface roughness, shape, and size data ” all with one measurement technique. Bruker™s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional metrology and 3D surface analysis.   Contour CMM provides engineers and researchers the ability to perform simultaneous nanoscale height and surface texture, and 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument.  

The world's first CMM that can provide surface roughness, shape, and size data ” all with one measurement technique.
Bruker™s Contour CMM system is specifically designed to measure the small features found in the increasing number of applications that require both precise dimensional metrology and 3D surface analysis.
 
Contour CMM provides engineers and researchers the ability to perform simultaneous nanoscale height and surface texture, and 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument.
 

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Technical Specifications

  Bruker Corporation
Product Category Coordinate Measuring Machines (CMM)
Product Name Optical Coordinate Measurement Machine (CMM)
Application Dimensional Measurement; Profile Measurement; Angularity / Orientation; Depth Mapping
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