ASTM International Standard Terminology Relating to Surface Analysis ASTM E673-02

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1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
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Description
1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
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Standard Terminology Relating to Surface Analysis - ASTM E673-02 - ASTM International
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Standard Terminology Relating to Surface Analysis
ASTM E673-02
Standard Terminology Relating to Surface Analysis ASTM E673-02
1.1 This terminology is related to the various disciplines involved in surface analysis. 1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

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  ASTM International
Product Category Standards and Technical Documents
Product Number ASTM E673-02
Product Name Standard Terminology Relating to Surface Analysis
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