Artifex Engineering Laser Diode Test System LIV100

Description
The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for Diode characterization at the chip or bar level Quality control of incoming goods OEM We offer this instrument with a variety of end stages covering current ranges from 1A up to 400A. A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s for 200 current steps 1 including the data transfer to the host computer. Specifications Current: from 1A up to 400A Rise time: <50ns 2 Throughput: <1s per diode 1 USB-controlled via command list Up to 6 channels of synchronized data acquisition Optical spectrum: resolution~0.1nm
Description
The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for Diode characterization at the chip or bar level Quality control of incoming goods OEM We offer this instrument with a variety of end stages covering current ranges from 1A up to 400A. A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s for 200 current steps 1 including the data transfer to the host computer. Specifications Current: from 1A up to 400A Rise time: <50ns 2 Throughput: <1s per diode 1 USB-controlled via command list Up to 6 channels of synchronized data acquisition Optical spectrum: resolution~0.1nm

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Laser Diode Test System - LIV100 - Artifex Engineering
Emden, Germany
Laser Diode Test System
LIV100
Laser Diode Test System LIV100
The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for Diode characterization at the chip or bar level Quality control of incoming goods OEM We offer this instrument with a variety of end stages covering current ranges from 1A up to 400A. A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s for 200 current steps 1 including the data transfer to the host computer. Specifications Current: from 1A up to 400A Rise time: <50ns 2 Throughput: <1s per diode 1 USB-controlled via command list Up to 6 channels of synchronized data acquisition Optical spectrum: resolution~0.1nm

The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for

  • Diode characterization at the chip or bar level
  • Quality control of incoming goods
  • OEM

We offer this instrument with a variety of end stages covering current ranges from 1A up to 400A. A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s for 200 current steps 1 including the data transfer to the host computer.

Specifications

  • Current: from 1A up to 400A
  • Rise time: <50ns 2
  • Throughput: <1s per diode 1
  • USB-controlled via command list
  • Up to 6 channels of synchronized data acquisition
  • Optical spectrum: resolution~0.1nm
Supplier's Site

Technical Specifications

  Artifex Engineering
Product Category Curve Tracers
Product Number LIV100
Product Name Laser Diode Test System
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