Aries Electronics, Inc. Sockets for ICs, Transistors 48-6574-18

The 48-6574-18 is a Zero-Insertion-Force (ZIF) DIP test socket designed for quick and efficient device insertion and removal. It accommodates devices with pin centers ranging from 0.300 to 0.600 inches and supports various pin counts. The socket features a quick-release handle that swings down to open contacts for easy device insertion, automatically returning to close onto the device leads. It can be soldered into PCBs or plugged into any compatible socket. Constructed from black UL 94V-0 glass-filled polyphenylene sulfide (PPS) for standard applications, it is also available in high-temperature polyetheretherketone (PEEK). The handle is made of stainless steel, and the contact materials include beryllium copper (BeCu) with various plating options, ensuring durability and reliability. The socket has a contact current rating of 1 amp, insulation resistance of 1000 MOc minimum, and a dielectric withstand voltage of 1000 VAC. It is rated for a life cycle of 25,000 to 50,000 cycles and operates within a temperature range of -85¬8F to 221¬8F for standard plating, with higher limits for other plating options. This socket is suitable for applications requiring frequent device changes and testing, making it a practical choice for engineers looking for reliable and versatile IC socket solutions.