Aries Electronics, Inc. Sockets for ICs, Transistors 40-3575-16

The 40-3575-16 is a Zero-Insertion-Force DIP test socket designed for quick-release functionality, accommodating devices with pin centers ranging from 0.300 to 0.600 inches. It features a handle that swings down to open contacts for easy device insertion and automatically returns to secure the device leads upon release. The socket can be soldered into PCBs or plugged into compatible sockets. Constructed from black UL 94V-0 glass-filled polyphenylene sulfide (PPS) for standard applications, it also offers a high-temperature variant made from polyetheretherketone (PEEK). The handle is made of stainless steel, while the contact materials include beryllium copper (BeCu) with various plating options, ensuring durability and reliability. The socket supports a contact current rating of 1 amp and has an insulation resistance of at least 1000 MΩ. It operates effectively within a temperature range of -85°F to 221°F for standard plating, with higher limits for other plating types. With a life cycle rating of 25,000 to 50,000 cycles and a retention force of 55g per pin, this socket is suitable for various testing and prototyping applications. It accepts leads measuring between 0.015 to 0.035 inches wide and 0.110 to 0.280 inches long, making it versatile for different devices.