Zygo Corporation 3D Optical Profiler Nexview™ 650

Description
Large Format Inspection & Metrology The Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. Powerful Performance Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system. This non-contact technique provides high-precision, and high-value surface metrology benefits including: Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps. Sub-nanometer measurement precision is independent of field magnification Gage capable performance - exceptional precision and repeatability for the most demanding production applications. SureScan™ vibration tolerance technology - robust operation in virtually any environment. Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.
Description
Large Format Inspection & Metrology The Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. Powerful Performance Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system. This non-contact technique provides high-precision, and high-value surface metrology benefits including: Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps. Sub-nanometer measurement precision is independent of field magnification Gage capable performance - exceptional precision and repeatability for the most demanding production applications. SureScan™ vibration tolerance technology - robust operation in virtually any environment. Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.

Suppliers

Company
Product
Description
Supplier Links
3D Optical Profiler - Nexview™ 650 - Zygo Corporation
Middlefield, CT, United States
3D Optical Profiler
Nexview™ 650
3D Optical Profiler Nexview™ 650
Large Format Inspection & Metrology The Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. Powerful Performance Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system. This non-contact technique provides high-precision, and high-value surface metrology benefits including: Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps. Sub-nanometer measurement precision is independent of field magnification Gage capable performance - exceptional precision and repeatability for the most demanding production applications. SureScan™ vibration tolerance technology - robust operation in virtually any environment. Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.

Large Format Inspection & Metrology

The Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision.

Powerful Performance

Coherence Scanning Interferometry (CSI) is the measurement technology at the core of the Nexview™ 650 system.

This non-contact technique provides high-precision, and high-value surface metrology benefits including:

  • Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps.
  • Sub-nanometer measurement precision is independent of field magnification
  • Gage capable performance - exceptional precision and repeatability for the most demanding production applications.
  • SureScan™ vibration tolerance technology - robust operation in virtually any environment.
  • Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.
Supplier's Site

Technical Specifications

  Zygo Corporation
Product Category 3D Scanners
Product Number Nexview™ 650
Product Name 3D Optical Profiler
Control PC
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