ZYGO's Compass™ 2 metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact camera modules found in smart phones, tablets, and automotive vision systems. At their core is ZYGO’s Coherence Scanning Interferometry (CSI) technology which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control.
There are two models of Compass 2 systems available, depending on your metrology needs
Compass 2 – ZYGO's advanced solution for precision metrology of micro lens surface form, deviation from prescription, and relational/dimension
al parameters. This is the ideal choice for applications that require the analysis of rotationally symmetric spherical and aspheric, geometrically truncated, and freeform surfaces.
Compass RT – A fast and flexible system for precision metrology of micro lens relational/dimension
al parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.
ZYGO's Compass™ 2 metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact camera modules found in smart phones, tablets, and automotive vision systems.
At their core is ZYGO’s Coherence Scanning Interferometry (CSI) technology which delivers industry-leading precision, versatility and speed for repeatable metrology and production process control.
There are two models of Compass 2 systems available, depending on your metrology needs
- Compass 2 – ZYGO's advanced solution for precision metrology of micro lens surface form, deviation from prescription, and relational/dimensional parameters. This is the ideal choice for applications that require the analysis of rotationally symmetric spherical and aspheric, geometrically truncated, and freeform surfaces.
- Compass RT – A fast and flexible system for precision metrology of micro lens relational/dimensional parameters, plus general profilometry applications. This is the ideal choice when form deviation metrology is not required.
