AENOR UNE-EN 62047-8:2011

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Semiconductor devices - Micro-electromechani cal devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
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Description
Semiconductor devices - Micro-electromechani cal devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
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UNE-EN 62047-8:2011 - - AENOR
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UNE-EN 62047-8:2011
UNE-EN 62047-8:2011
Semiconductor devices - Micro-electromechani cal devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)

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  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 62047-8:2011
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