AENOR UNE-EN 62047-17:2015

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Semiconductor devices - Micro-electromechani cal devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)
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Description
Semiconductor devices - Micro-electromechani cal devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)
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UNE-EN 62047-17:2015 - - AENOR
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UNE-EN 62047-17:2015
UNE-EN 62047-17:2015
Semiconductor devices - Micro-electromechani cal devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)

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  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 62047-17:2015
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