AENOR UNE-EN 62047-13:2012

Description
Semiconductor devices - Micro-electromechani cal devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
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Description
Semiconductor devices - Micro-electromechani cal devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
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UNE-EN 62047-13:2012 - - AENOR
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UNE-EN 62047-13:2012
UNE-EN 62047-13:2012
Semiconductor devices - Micro-electromechani cal devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)

Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)

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Technical Specifications

  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 62047-13:2012
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