AENOR UNE-EN 60749-39:2006

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Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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Description
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
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UNE-EN 60749-39:2006 -  - AENOR
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UNE-EN 60749-39:2006
UNE-EN 60749-39:2006
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 60749-39:2006
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