AENOR UNE-EN 60749-20:2009

Description
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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Description
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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UNE-EN 60749-20:2009 -  - AENOR
MadrId, Spain
UNE-EN 60749-20:2009
UNE-EN 60749-20:2009
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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Technical Specifications

  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 60749-20:2009
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