AENOR UNE-EN 60749-14:2004

Description
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
  • UNE-EN 60749-14:2004 - AENOR
    AENOR
Request a Quote
Description
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Request a Quote

Suppliers

Company
Product
Description
Supplier Links
UNE-EN 60749-14:2004 - - AENOR
AENOR
MadrId, Spain
UNE-EN 60749-14:2004
UNE-EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

Supplier's Site

Technical Specifications

  AENOR
Product Category Standards and Technical Documents
Product Name UNE-EN 60749-14:2004
Unlock Full Specs
to access all available technical data

Similar Products