Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
| AENOR | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Name | UNE-EN 15991:2011 |
