AENOR PNE-prEN 60749-38

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Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory
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Description
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory
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PNE-prEN 60749-38
PNE-prEN 60749-38
Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory

Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory

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Technical Specifications

  AENOR
Product Category Standards and Technical Documents
Product Name PNE-prEN 60749-38
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