Primarius 1/f Noise Measurement System 9812DX

Description
9812DX is an enhanced version of the industry's de-facto standard flicker noise measurement systems 9812D and 9812B, and sets new records for measurement speed, system resolution and coverage of different types of measurement requirements for flicker noise and random telegraph noise (RTN or RTS).It includes a more than 10X increase in system resolution than previous systems, higher voltage support up to 200V, and lower current support down to 0.1nA, providing extended capability to cover extreme conditions such as diode dark current noise. 9812DX is the only system on the market that supports a complete range of measurement conditions for both high and low impedance devices, with the range of 10-10MO, and the system has been proven for the most advanced technology nodes, from 16 nm and 14nm to 10nm and 7nm technology development. 9812DX also sets a high-speed record, with a typical noise measurement speed of 10 sec/bias, enabling fast and accurate noise characterization to meet the needs of process quality monitoring, statistical noise analysis and advanced circuit designs.
Description
9812DX is an enhanced version of the industry's de-facto standard flicker noise measurement systems 9812D and 9812B, and sets new records for measurement speed, system resolution and coverage of different types of measurement requirements for flicker noise and random telegraph noise (RTN or RTS).It includes a more than 10X increase in system resolution than previous systems, higher voltage support up to 200V, and lower current support down to 0.1nA, providing extended capability to cover extreme conditions such as diode dark current noise. 9812DX is the only system on the market that supports a complete range of measurement conditions for both high and low impedance devices, with the range of 10-10MO, and the system has been proven for the most advanced technology nodes, from 16 nm and 14nm to 10nm and 7nm technology development. 9812DX also sets a high-speed record, with a typical noise measurement speed of 10 sec/bias, enabling fast and accurate noise characterization to meet the needs of process quality monitoring, statistical noise analysis and advanced circuit designs.

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1/f Noise Measurement System - 9812DX - Primarius
Shanghai, China
1/f Noise Measurement System
9812DX
1/f Noise Measurement System 9812DX
9812DX is an enhanced version of the industry's de-facto standard flicker noise measurement systems 9812D and 9812B, and sets new records for measurement speed, system resolution and coverage of different types of measurement requirements for flicker noise and random telegraph noise (RTN or RTS).It includes a more than 10X increase in system resolution than previous systems, higher voltage support up to 200V, and lower current support down to 0.1nA, providing extended capability to cover extreme conditions such as diode dark current noise. 9812DX is the only system on the market that supports a complete range of measurement conditions for both high and low impedance devices, with the range of 10-10MO, and the system has been proven for the most advanced technology nodes, from 16 nm and 14nm to 10nm and 7nm technology development. 9812DX also sets a high-speed record, with a typical noise measurement speed of 10 sec/bias, enabling fast and accurate noise characterization to meet the needs of process quality monitoring, statistical noise analysis and advanced circuit designs.

9812DX is an enhanced version of the industry's de-facto standard flicker noise measurement systems 9812D and 9812B, and sets new records for measurement speed, system resolution and coverage of different types of measurement requirements for flicker noise and random telegraph noise (RTN or RTS).It includes a more than 10X increase in system resolution than previous systems, higher voltage support up to 200V, and lower current support down to 0.1nA, providing extended capability to cover extreme conditions such as diode dark current noise. 9812DX is the only system on the market that supports a complete range of measurement conditions for both high and low impedance devices, with the range of 10-10MO, and the system has been proven for the most advanced technology nodes, from 16 nm and 14nm to 10nm and 7nm technology development. 9812DX also sets a high-speed record, with a typical noise measurement speed of 10 sec/bias, enabling fast and accurate noise characterization to meet the needs of process quality monitoring, statistical noise analysis and advanced circuit designs.

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Technical Specifications

  Primarius
Product Category Noise Meters
Product Number 9812DX
Product Name 1/f Noise Measurement System
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