Hitachi High-Tech America Coating Thickness Analyzer X-Strata920

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range from 13Al to 92U on the periodic table. X-Strata920 Proportional counter or high resolution SDD Element range : Ti - U or Al - U (SDD) Chamber design : slotted XY stage options : fixed base, deep well, motorized Largest sample : 270 x 500 x 150 mm Maximum number of collimators : 6 Filters : 1 Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil) SmartLink software