Matexcel Microscopy Reference Standard 807 ASS-807

Description
Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Unmounted or unmounted on 12 mm steel disks
  • Microscopy Reference Standard 807 - ASS-807 - Matexcel
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Datasheet
Description
Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Unmounted or unmounted on 12 mm steel disks
Datasheet

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Microscopy Reference Standard 807 - ASS-807 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 807
ASS-807
Microscopy Reference Standard 807 ASS-807
Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Unmounted or unmounted on 12 mm steel disks

Pitch: 144nm
Surface feature: Aluminum bumps
Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.)
Mounting: Unmounted or unmounted on 12 mm steel disks

Supplier's Site Datasheet

Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-807
Product Name Microscopy Reference Standard 807
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