The Luna 6415 is a fast and simple-to-use analyzer for passive optical components and modules. The Luna 6415 extends the industry-leading optical frequency domain reflectometry (OFDR) platform from Luna Innovations to manufacturing test and quality control applications.
Unlike traditional passive component testers, the Luna 6415 measures and analyzes the Insertion Loss (IL) and Return Loss (RL) distribution, as well as length, working in either reflection or transmission. The Luna 6415 features extremely high sensitivity, 20 μm spatial sampling resolution, and very fast scanning for high test throughput.
The Luna 6415 delivers the comprehensive and high-speed testing needed for modern silicon photonics and other photonic integrated circuits (PICs):
Measure transmission and in reflection
Transmission loss and return loss (RL) spectral analysis
Distributed reflection loss (RL) versus length – easily measure waveguide scattering
High spatial resolution (20 µm)
By integrating both reflection and transmission measurements, the Luna 6415 provides more complete test coverage of your component. The Luna 6415 further simplifies your manufacturing test with an integrated tunable laser source, automated IL and RL calculations, self-calibration and very high scanning speeds for greater test throughput.
The Luna 6415 is a fast and simple-to-use analyzer for passive optical components and modules. The Luna 6415 extends the industry-leading optical frequency domain reflectometry (OFDR) platform from Luna Innovations to manufacturing test and quality control applications.
Unlike traditional passive component testers, the Luna 6415 measures and analyzes the Insertion Loss (IL) and Return Loss (RL) distribution, as well as length, working in either reflection or transmission. The Luna 6415 features extremely high sensitivity, 20 μm spatial sampling resolution, and very fast scanning for high test throughput.
The Luna 6415 delivers the comprehensive and high-speed testing needed for modern silicon photonics and other photonic integrated circuits (PICs):
- Measure transmission and in reflection
- Transmission loss and return loss (RL) spectral analysis
- Distributed reflection loss (RL) versus length – easily measure waveguide scattering
- High spatial resolution (20 µm)
By integrating both reflection and transmission measurements, the Luna 6415 provides more complete test coverage of your component. The Luna 6415 further simplifies your manufacturing test with an integrated tunable laser source, automated IL and RL calculations, self-calibration and very high scanning speeds for greater test throughput.
