JEOL USA, Inc. JXA-iSP100 Electron Probe Microanalyzer (EPMA)

Description
Features Setting Holder insertion with Auto Loading! Quickly find the target observation point! Specimen insertion and acquisition of an optical image of the specimen holder (Stage Navigation image) is executed with a single click. The field for analysis can be selected from the Stage Navigation image. Analysis Auto functions enabling anyone to obtain high quality SEM images Easy EPMA for fast elemental analysis with simplified instrument setting In combination of the Auto Focus function of an optical microscope and Auto functions of SEM incorporating a new system with higher accuracy and faster degree of capabilities, any user can acquire high quality SEM images. “Live Analysis” enables elemental screening during observation. “Easy EPMA” is available, so novice users can smoothly operate the EPMA. “EPMA-XRF integration” allows for condition setting of EPMA based on the XRF data. Integration of WD/ED provides efficient analysis time. Operability is further enhanced with the integration of SEM, EDS, WDS and optical images. Setting screen and displayed data of Easy EPMA EDS Live Analysis Example of reduced analysis time due to WD/ED integration Integration: Single click enables setting of the analyzing crystal combination based on the elements recommended through data from the techniques as above. Self Maintenance Efficient Calibration with 18 built-in standard specimens The new spectrometer calibration function reduces the steps of periodic calibration and eliminates misoperations by using in-built standard specimens. Greater efficiency by running automated instrument calibration in the nighttime. The maintenance notification function ensures proper maintenance at the required timing. 18 built-in standard specimens for calibration Maintenance notification function "Customer Support Tool" Link News Release(2019/11/13) Release of New Electron Probe Microanalyzers JXA-iHP200F and JXA-iSP100 - Evolution of Integrated EPMA - JXA-iHP200F/JXA-iSP1 00 Special Contents
  • JXA-iSP100 Electron Probe Microanalyzer (EPMA) - JEOL USA, Inc.
    JEOL USA, Inc.
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Description
Features Setting Holder insertion with Auto Loading! Quickly find the target observation point! Specimen insertion and acquisition of an optical image of the specimen holder (Stage Navigation image) is executed with a single click. The field for analysis can be selected from the Stage Navigation image. Analysis Auto functions enabling anyone to obtain high quality SEM images Easy EPMA for fast elemental analysis with simplified instrument setting In combination of the Auto Focus function of an optical microscope and Auto functions of SEM incorporating a new system with higher accuracy and faster degree of capabilities, any user can acquire high quality SEM images. “Live Analysis” enables elemental screening during observation. “Easy EPMA” is available, so novice users can smoothly operate the EPMA. “EPMA-XRF integration” allows for condition setting of EPMA based on the XRF data. Integration of WD/ED provides efficient analysis time. Operability is further enhanced with the integration of SEM, EDS, WDS and optical images. Setting screen and displayed data of Easy EPMA EDS Live Analysis Example of reduced analysis time due to WD/ED integration Integration: Single click enables setting of the analyzing crystal combination based on the elements recommended through data from the techniques as above. Self Maintenance Efficient Calibration with 18 built-in standard specimens The new spectrometer calibration function reduces the steps of periodic calibration and eliminates misoperations by using in-built standard specimens. Greater efficiency by running automated instrument calibration in the nighttime. The maintenance notification function ensures proper maintenance at the required timing. 18 built-in standard specimens for calibration Maintenance notification function "Customer Support Tool" Link News Release(2019/11/13) Release of New Electron Probe Microanalyzers JXA-iHP200F and JXA-iSP100 - Evolution of Integrated EPMA - JXA-iHP200F/JXA-iSP1 00 Special Contents
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JXA-iSP100 Electron Probe Microanalyzer (EPMA) - - JEOL USA, Inc.
JEOL USA, Inc.
Peabody, MA, United States
JXA-iSP100 Electron Probe Microanalyzer (EPMA)
JXA-iSP100 Electron Probe Microanalyzer (EPMA)
Features Setting Holder insertion with Auto Loading! Quickly find the target observation point! Specimen insertion and acquisition of an optical image of the specimen holder (Stage Navigation image) is executed with a single click. The field for analysis can be selected from the Stage Navigation image. Analysis Auto functions enabling anyone to obtain high quality SEM images Easy EPMA for fast elemental analysis with simplified instrument setting In combination of the Auto Focus function of an optical microscope and Auto functions of SEM incorporating a new system with higher accuracy and faster degree of capabilities, any user can acquire high quality SEM images. “Live Analysis” enables elemental screening during observation. “Easy EPMA” is available, so novice users can smoothly operate the EPMA. “EPMA-XRF integration” allows for condition setting of EPMA based on the XRF data. Integration of WD/ED provides efficient analysis time. Operability is further enhanced with the integration of SEM, EDS, WDS and optical images. Setting screen and displayed data of Easy EPMA EDS Live Analysis Example of reduced analysis time due to WD/ED integration Integration: Single click enables setting of the analyzing crystal combination based on the elements recommended through data from the techniques as above. Self Maintenance Efficient Calibration with 18 built-in standard specimens The new spectrometer calibration function reduces the steps of periodic calibration and eliminates misoperations by using in-built standard specimens. Greater efficiency by running automated instrument calibration in the nighttime. The maintenance notification function ensures proper maintenance at the required timing. 18 built-in standard specimens for calibration Maintenance notification function "Customer Support Tool" Link News Release(2019/11/13) Release of New Electron Probe Microanalyzers JXA-iHP200F and JXA-iSP100 - Evolution of Integrated EPMA - JXA-iHP200F/JXA-iSP1 00 Special Contents

Features

Setting

Holder insertion with Auto Loading! Quickly find the target observation point!


Specimen insertion and acquisition of an optical image of the specimen holder (Stage Navigation image) is executed with a single click.
The field for analysis can be selected from the Stage Navigation image.


Analysis

Auto functions enabling anyone to obtain high quality SEM images Easy EPMA for fast elemental analysis with simplified instrument setting


In combination of the Auto Focus function of an optical microscope and Auto functions of SEM incorporating a new system with higher accuracy and faster degree of capabilities, any user can acquire high quality SEM images. “Live Analysis” enables elemental screening during observation. “Easy EPMA” is available, so novice users can smoothly operate the EPMA. “EPMA-XRF integration” allows for condition setting of EPMA based on the XRF data. Integration of WD/ED provides efficient analysis time. Operability is further enhanced with the integration of SEM, EDS, WDS and optical images.


Setting screen and displayed data of Easy EPMA


EDS Live Analysis


Example of reduced analysis time due to WD/ED integration


Integration: Single click enables setting of the analyzing crystal combination based on the elements recommended through data from the techniques as above.


Self Maintenance

Efficient Calibration with 18 built-in standard specimens


The new spectrometer calibration function reduces the steps of periodic calibration and eliminates misoperations by using in-built standard specimens.
Greater efficiency by running automated instrument calibration in the nighttime.
The maintenance notification function ensures proper maintenance at the required timing.


18 built-in standard specimens for calibration


Maintenance notification function "Customer Support Tool"


Link

  • News Release(2019/11/13)

Release of New Electron Probe Microanalyzers JXA-iHP200F and JXA-iSP100 - Evolution of Integrated EPMA -

JXA-iHP200F/JXA-iSP100 Special Contents

Supplier's Site

Technical Specifications

  JEOL USA, Inc.
Product Category Uncategorized Products
Product Name JXA-iSP100 Electron Probe Microanalyzer (EPMA)
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