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ESPEC North America Inc | Qualmark Products and Services Highly Accelerated Stress Test (HAST) Chamber EHS-222M

Description
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks. Our HAST systems have a modern design that's easier to use: Automatic humidity filling Automatic door lock A round workspace, allowing wider sample boards to be loaded Convenient, hermetic power-pin system for bias testing Operation Features: Unsaturated or saturated humidity control Multi-mode M System (wet bulb/dry bulb) controls humidity, even during heat-up and cool-down. Fully conforms to EIA/JEDEC Test Method A110 & 102C. Touch-screen controller with temperature, humidity, and count-down display. Includes Ethernet interface. 12 Specimen power terminals, allows power-up of specimens (12 per workspace on "double" units) Automatic fill of the humidity water at the start of a test (except EHS-431M) CABINET FEATURES: Inner cylinder and door shield protect specimens from dew condensation Interior is cylindrical for maximum product loading Two stainless steel shelves Set of casters for easy movement of the chamber (except double units) Push button door lock Bottom of the unit allows storage space for peripheral equipment SAFETY FEATURES: Overheat & over-pressure protectors Door lock safety mechanism to prevent opening of the door while the chamber is pressurized Specimen power control terminal: shuts down the product power in the event of an alarm
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Suppliers

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Product
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Highly Accelerated Stress Test (HAST) Chamber - EHS-222M - ESPEC North America Inc | Qualmark Products and Services
Aurora, CO, United States
Highly Accelerated Stress Test (HAST) Chamber
EHS-222M
Highly Accelerated Stress Test (HAST) Chamber EHS-222M
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks. Our HAST systems have a modern design that's easier to use: Automatic humidity filling Automatic door lock A round workspace, allowing wider sample boards to be loaded Convenient, hermetic power-pin system for bias testing Operation Features: Unsaturated or saturated humidity control Multi-mode M System (wet bulb/dry bulb) controls humidity, even during heat-up and cool-down. Fully conforms to EIA/JEDEC Test Method A110 & 102C. Touch-screen controller with temperature, humidity, and count-down display. Includes Ethernet interface. 12 Specimen power terminals, allows power-up of specimens (12 per workspace on "double" units) Automatic fill of the humidity water at the start of a test (except EHS-431M) CABINET FEATURES: Inner cylinder and door shield protect specimens from dew condensation Interior is cylindrical for maximum product loading Two stainless steel shelves Set of casters for easy movement of the chamber (except double units) Push button door lock Bottom of the unit allows storage space for peripheral equipment SAFETY FEATURES: Overheat & over-pressure protectors Door lock safety mechanism to prevent opening of the door while the chamber is pressurized Specimen power control terminal: shuts down the product power in the event of an alarm

HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, not weeks. Our HAST systems have a modern design that's easier to use:

  • Automatic humidity filling
  • Automatic door lock
  • A round workspace, allowing wider sample boards to be loaded
  • Convenient, hermetic power-pin system for bias testing

Operation Features:

  • Unsaturated or saturated humidity control
  • Multi-mode M System (wet bulb/dry bulb) controls humidity, even during heat-up and cool-down. Fully conforms to EIA/JEDEC Test Method A110 & 102C.
  • Touch-screen controller with temperature, humidity, and count-down display. Includes Ethernet interface.
  • 12 Specimen power terminals, allows power-up of specimens (12 per workspace on "double" units)
  • Automatic fill of the humidity water at the start of a test (except EHS-431M)

CABINET FEATURES:

  • Inner cylinder and door shield protect specimens from dew condensation
  • Interior is cylindrical for maximum product loading
  • Two stainless steel shelves
  • Set of casters for easy movement of the chamber (except double units)
  • Push button door lock
  • Bottom of the unit allows storage space for peripheral equipment

SAFETY FEATURES:

  • Overheat & over-pressure protectors
  • Door lock safety mechanism to prevent opening of the door while the chamber is pressurized
  • Specimen power control terminal: shuts down the product power in the event of an alarm
Supplier's Site Datasheet

Technical Specifications

  ESPEC North America Inc | Qualmark Products and Services
Product Category Automated Test Equipment
Product Number EHS-222M
Product Name Highly Accelerated Stress Test (HAST) Chamber
Type / Form Module, Sub-system or ATE Component; Test Chamber
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