Smiths Interconnect Datasheets for IC Sockets and Headers

IC sockets and headers are board-mounted female connectors that serve as carriers for integrated circuit (IC) chips.
IC Sockets and Headers: Learn more

Product Name Notes
Peripheral Tri-Temp Test: Celsius Series
5A continues current carrying capacity and capable -50 to 170deg C test environment. Proprietary contact design with wiping action at device pad to ensure consistent contact resistance. Minimal scrub action...
Standard Array & Peripheral Test: Standard Test socket
Customized test sockets for any IC packages. Suitable for lab, Engineering, SLT & ATE test application. Wide selection of Smiths Interconnects spring pins with low and stable contact resistance. World...
Galileo Test Socket: Low-profile Test Socket
Features & Benefits Patented, low profile contact Solderless memory replacement Short signal path Conformal to recessed LGAs High speed signal integrity Electrically transparent contact High frequency bandwidth > 40GHz Low...
Array PoP Test: Euclid Series
Highly precised top and bottom array simultaneous test capable socket for effective package on package test. Customized socket design is capable to test high speed signals in lab, engineering, SLT...
Peripheral Strip Test: Gutenberg Series
Highly reliable multi site strip test socket . Customized design to suite any strip test handler. High parallelism offers higher throughput. Features & Benefits Gutenberg sockets address requirements of the...
Array High Speed Test - DaVinci Series: Sockets for High Speed Test
IC developers are increasingly integrating functionalities within a single package, escalating the complexity of test. Higher speed digital and analog devices are being manufactured at record volumes and the need...
Thermal Management Lid Capabilities: IC Test Solutions
Smiths Interconnect offers high value Thermal Management Lid capabilities including air-chilled or liquid cooled technology, capable of dissipating up to 650 Watts. Our solutions are developed to be compatible with...
Array High Speed Test - DaVinci Gen V
The next generation of high-performance semiconductors—from advanced Consumer SoCs and GPUs to AI Accelerators and Data Center processors demands unprecedented bandwidth and speed. Yet as data rates climb, ensuring signal...
Array High Speed Test - DaVinci Micro Test Socket: Impedance Controlled Coaxial Solution for High Speed Test
The rapid expansion of connected devices and data-intensive applications are driving the growing demand for highly efficient and adaptive high-performance computing solutions. Whether it’s a complex SoC for a mobile...