CMM Probes from Renishaw

Surface Finish Probe -- Revo® SFP2

Surface Finish Probe -- Revo® SFP2 -- View Larger Image
Surface Finish Probe -- Revo® SFP2-Image

Surface finish measurement has traditionally involved the use of hand‑held sensors or has required for the part to be moved onto a dedicated measuring machine. The REVO multisensor system changes all this, making surface finish inspection an integral part of your CMM measurement and enabling you to switch between scanning and surface finish measurement. This unique capability allows the surface finish analysis to be fully integrated into a single measurement report.

Powered by 5-axis measurement technology, the SFP2's automated surface finish inspection offers significant time savings, reduced part handling and greater return on CMM investment.

The SFP2 system – features and benefits

The SFP2 system consists of a probe and a range of modules, which are automatically interchangeable with all other probe options available for REVO, providing the flexibility to easily select the optimum tool to inspect a wide range of features, all on one CMM platform. Data from multiple sensors is automatically referenced to a common datum.

  • Surface finish measurement is fully integrated with the standard CMM inspection program thanks to the automatic changing of the SFP2 probe and stylus holders using the MRS-2 rack and RCP TC-3 ports.
  • The SFP2 probe takes advantage of the infinite positioning and 5-axis movement capability of the REVO-2 head.
  • Access to the most difficult to reach features is provided by an integral probe C-axis, coupled with various tip geometries and a knuckle joint between module and holder.