Nondestructive Testing (NDT) Probes from Hitachi High-Tech Analytical Science

PCB Thru-Hole and Copper Thickness Gauge -- CMI760

 
 
PCB Thru-Hole and Copper Thickness Gauge -- CMI760 -- View Larger Image
PCB Thru-Hole and Copper Thickness Gauge -- CMI760-Image

Specifications

Product Category
Nondestructive Testing (NDT) Probes
NDT Probe Technology
Eddy Current
Application
 
Probe Style
 
Features & Format
 
Measurement Range
 
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