Nondestructive Testing (NDT) Probes from Hitachi High-Tech Analytical Science

Temperature Compensated Surface and Trace Copper Thickness Gauge -- CMI165

 
 
Temperature Compensated Surface and Trace Copper Thickness Gauge -- CMI165 -- View Larger Image
Temperature Compensated Surface and Trace Copper Thickness Gauge -- CMI165-Image

Specifications

Product Category
Nondestructive Testing (NDT) Probes
NDT Probe Technology
Eddy Current
Application
 
Probe Style
 
Features & Format
 
Measurement Range
 
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