XT V 160 NF Nanofocus X-ray inspection
XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.
- <0.1 µm feature recognition up to 6 W power
- High precision manipulator with vibration reduction
- 3Mpixel flat panel for ultra high definition
- Large tray to load multiple components and boards as well as 450 mm wafer ready
- Productivity increase by automation and instant reporting