Wafer and Thin Film Instrumentation from SemiProbe

IRIS DIE & Wafer Inspection Systems -- FA Fully Automatic Inspection System

 
 
IRIS DIE & Wafer Inspection Systems -- FA Fully Automatic Inspection System -- View Larger Image
IRIS DIE & Wafer Inspection Systems -- FA Fully Automatic Inspection System-Image

Specifications

Product Category
Wafer and Thin Film Instrumentation
Form Factor
ProbingSystem
Mounting / Loading
 
Technology
 
Applications
 
Measurements