Wafer and Thin Film Instrumentation from SemiProbe

Specialty Probe System -- Simultaneous Double-Sided Prober (DSP)

 
 
Specialty Probe System -- Simultaneous Double-Sided Prober (DSP) -- View Larger Image
Specialty Probe System -- Simultaneous Double-Sided Prober (DSP)-Image

Specifications

Product Category
Wafer and Thin Film Instrumentation
Form Factor
ProbingSystem
Mounting / Loading
Manual loading
Technology
Optical / Imaging
Applications
 
Measurements
 
Wafer / Part Size