Wafer and Thin Film Instrumentation from SemiProbe
Specialty Probe System -- Simultaneous Double-Sided Prober (DSP)
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.
Specifications
Product Category
Wafer and Thin Film Instrumentation
Form Factor
ProbingSystem
Mounting / Loading
Manual loading
Technology
Optical / Imaging
More Information
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