Wafer and Thin Film Instrumentation from SemiProbe

Lab Assistant Probe System -- LA-200 DC

 
 
Lab Assistant Probe System -- LA-200 DC -- View Larger Image
Lab Assistant Probe System -- LA-200 DC-Image

Specifications

Product Category
Wafer and Thin Film Instrumentation
Form Factor
ProbingSystem
Mounting / Loading
Manual loading
Technology
Optical / Imaging
Applications
 
Measurements
 
Wafer / Part Size