Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.
This solution uses a new methodology, according to Dr. John Schultz of Compass Technology, “Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss. This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.”
The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.
The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.