- Trained on our vast library of engineering resources.

Smiths Interconnect Datasheets for Electrical Test Probes

Electric test probes are used to establish a connection between a circuit under test and the measuring instrument.
Electrical Test Probes: Learn more

Product Name Notes
Double-ended probes feature both a top-side and bottom-side compliant plunger. Double-ended receptacles are available with a permanent bottom-side plunger and a replaceable probe on the top side. They are also...
Features & Benefits Technical Features Device contact pitch: 0.35mm pitch and above Operating Temperature Range: -55°C to 120°C Device packages: BGA, WLCSP, QFN Pin-to-pin tip distance is 0.07mm-0.14mm, depending on...
Interface probes for all major test equipment manufacturers. We also provide a variety of interface pins for use in test fixtures. Features & Benefits PI-410 Series pin 1.45 mm drill...
Offering two types of wireless receptacles, the R-100, R-075 and R-50C receptacles house a replaceable probe on the top end and have a permanent probe on the bottom end. These...
Smiths Interconnect offers the industry's most extensive line of high reliability coaxial probes. Our coaxial probes provide a low noise, controlled impedance signal path with reliable and easy connect/disconnect options.
Spring probes provide reliable electro-mechanical performance through hundreds of thousands of cycles. They are available in a variety of sizes, spring forces and terminations. Smiths Interconnect compression mount connectors utilizing...
Standard probe series for 0.039" (1.00 mm) pitch includes multiple length, travel, ICT, lead free and rotator options. ICT probe designs feature a bifurcated barrel with four separate fingers. The...
Standard probe series for 0.050" (1.27 mm) pitch includes multiple length, travel, ICT, lead free and rotator options. ICT probe designs feature a bifurcated barrel with four separate fingers. The...
Standard probe series for 0.075" (1.91 mm) pitch includes multiple length, travel, ICT, lead free and rotator options. ICT probe designs feature a bifurcated barrel with four separate fingers. The...
Standard probe series for 0.100" (2.54 mm) pitch includes multiple length, travel, ICT, lead free and rotator options. ICT probe designs feature a bifurcated barrel with four separate fingers. The...
Standard probe series for 0.125 (3.18) pitch includes multiple length and travel options. Smiths Interconnect offers a wide range of Spring Contact Probes to meet your testing needs and has...
Standard probe series for 0.156" (3.96 mm) and 0.187" (4.75 mm) pitches includes multiple length and travel options. Smiths Interconnect offers a wide range of Spring Contact Probes to meet...
Standard probe series for 0.187" (4.75 mm) and 0.300" (7.62 mm) pitches includes multiple length and travel options. Smiths Interconnect offers a wide range of Spring Contact Probes to meet...
Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes...
The Micro Probe Series ranges in pitch from 0.20" (0.51 mm) to 0.030" (0.76 mm) and are typically between 0.50" to 1.00" in length. Smiths Interconnect offers a wide range...
The SH Series features a bias ball, which is the most aggressive biasing technique to aid in assuring a low and consistent resistance, cycle after cycle. The SHE Series features...
The Volta Series Probe Head addresses a need for reduced test time set-up and increased throughput in high reliability testing of Wafer Level Packages (WLP), Wafer Level Chip Scale Packages...