Get reliable data quickly.

Sub-micron 3D observation/measurement

Observe steps in the nanometer range and measure height differences at the sub-micron level.

ISO25178-compliant surface roughness measurement

Measure surface roughness from linear to planar.

Non-contact, nondestructive, and fast

No sample preparation required—simply place the sample on the stage and you're ready to measure.

Features:

The OLS5000 microscope’s advanced technology enables it to capture high-resolution measurements of 3D samples.

The microscope’s scanning algorithm delivers improved data quality and improved speed to reduce scan time and streamline your workflow, resulting in improved productivity.

The OLS5000 microscope features automatic data capture so difficult setting adjustments are no longer necessary. Even users with minimal training can still obtain accurate results.

The low-output, non-contact, nondestructive laser means no sample preparation is required. Delicate materials can be measured without being damaged. The extension frame accommodates samples with a height of up to 210 mm, while the ultra-long working distance objective facilitates measurement of concavities as deep as 25 mm. In both cases, all you have to do is place the sample on the stage.