Microscopes from Nikon Metrology
Eclipse LV150N Industrial Microscope




A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
Microscope type
- Dedicated reflected illumination models
- Manual type
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
Specifications
Product Category
Microscopes
Application
Semiconductor
Grade
Benchtop
Magnification
1 to 150 X
Objective Lenses
4
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