Microscopes from Nikon Metrology

Eclipse L200N Series IC Inspection Microscope

 
 
Eclipse L200N Series IC Inspection Microscope -- View Larger Image
Eclipse L200N Series IC Inspection Microscope-Image

Specifications

Product Category
Microscopes
Application
Semiconductor
Grade
Benchtop
Magnification
1 to 150 X
Objective Lenses
4
Eyepiece Style
 
Features
 
User Interface
 
Remote Interface
 
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