Microscopes from Hitachi High Technologies America, Inc.
Scanning Electron Microscope -- SU3500




Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at low pressures. The SU3500 is sure to be the workhorse in any laboratory.
All new electron optics design with best-in-class image sharpness. 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.
Specifications
Product Category
Microscopes
Application
Biological / Life Sciences; Medical / Forensic
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