STEM imaging in the HT7700 is performed using Bright Field (BF) and annular Dark Field (DF) detectors. Contrast can be adjusted with push-button ease by choosing between diffraction-contrast or Z-contrast conditions. STEM imaging inherently reduces the impact of inelastically scattered electrons on image blur, allowing thicker samples to be imaged at low kV. Combining precision beam control of the STEM with EDX analysis enables simultaneous elemental mapping and imaging to see the elemental distribution.
|Resolution||1.5nm (BF-STEM, 100kV, defined by measuring|
the gap of sputtered gold particles)
|Magnification||x1,000～x800,000 (High Mag mode)|
x1,000～x100,000 (Normal mode)
x100～x2,000 (Low Mag mode)