Cosmic Equipment SpA Datasheets for Automated Test Equipment

Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum.
Automated Test Equipment: Learn more

Product Name Notes
HATINA GP is a general-purpose ATE system developed by Cosmic for high-parallelism testing of ASICs, PMICs, and Smart Power ICs/SoCs. Designed for both wafer-level and packaged device applications, the system...
FTI-1000 Flexible is a compact, multi-site ATE configuration designed for high-mix testing of medium-power Si and GaN discrete devices. Suitable for both engineering workflows and automated production, it integrates independent...
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Flexible Edition measures static parameters, dynamic switch performance, thermal...
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Turret Edition measures static parameters, dynamic switch performance, thermal...
The DMT from Cosmic is a compact, mixed-signal and digital automatic test equipment (ATE) designed for efficient IC validation. Thanks to its ultra-high hardware integration, it delivers more resources than...
The Hatina 4S by Cosmic is a compact, highly versatile ATE (Automatic Test Equipment) platform specifically designed for final test and WS of MEMS devices in high-volume production. Thanks to...
The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs.
VIP Extended is a highly configurable ATE system designed for parallel testing of silicon-based, SiC, and GaN devices, including high-side/low-side drivers, IGBTs, power MOSFETs, and power ICs. Engineered for use...