Polytec, Inc. Data Sheets for Wafer and Thin Film Instrumentation
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| Address: |
16400 Bake Parkway, Suites 150 & 200
Irvine,
CA 92618
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Contact: |
Web site
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Phone:
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(949) 943-3033
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Fax:
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(949) 679-0463
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Wafer and Thin Film Instrumentation:
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
Wafer and Thin Film Instrumentation: Learn more
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Notes |
| Advanced Vibrometry Tester -- AVT-1000 | For the best yields it is necessary to optimize your process. Measuring and understanding the characteristicsof your product allows continuous improvement. The AVT-1000 enables you to measure all critical parame-ters... | | Micro System Analyzer -- MSA-500 | The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. |
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