Wafer and Thin Film Instrumentation Data Sheets
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
| Wafer and Thin Film Instrumentation DataSheets From: |
Headquarters |
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Bruker Nano Surfaces Division
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Santa Barbara, CA
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Cascade Microtech, Inc.
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Beaverton, OR
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CeramTec North America
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Laurens, SC
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Corning Specialty Materials
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Corning, NY
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Hiden Analytical
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Livonia, MI
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Imego
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Sweden
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Martek Automation
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Murrieta, CA
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MTI Instruments Inc.
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Albany, NY
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Nikon Metrology, Inc.
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Brighton, MI
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Nor-Cal Products, Inc.
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Yreka, CA
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Olympus America Inc.
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Center Valley, PA
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Park Systems, Inc.
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Santa Clara, CA
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Phenom-World BV
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Netherlands
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Piezocryst Advanced Sensorics GmbH
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Austria
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Polytec, Inc.
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Irvine, CA
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Precitec, Inc.
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Wixom, MI
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Rigaku Corporation
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The Woodlands, TX
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TELOPS, Inc.
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Canada
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ULVAC Technologies, Inc.
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Methuen, MA
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Unitron Ltd.
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Commack, NY
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WDI Wise Device Inc.
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Canada
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Zygo Corporation
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Middlefield, CT
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