OMICRON NanoTechnology Data Sheets for Electron Microscopes
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12100 Singletree Ln, Ste. 199
Eden Prairie,
MN 55344
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Contact: |
Web site
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Phone:
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(952) 746-1613
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Fax:
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(952) 746-1320
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Electron Microscopes:
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition.
Electron Microscopes: Learn more
| Product Name |
Notes |
| Low Temperature STM | Atomic resolution at 5K, tip and sample exchange, 3-d tip positioning | | MULTISCAN LAB | Combination of STM, SEM and SAM for high resolution structural | | UHV NANOPROBE | Complete UHV system solution with multi point measurement tool | | CRYOGENIC SFM UHV System | Cryogenic SFM extends the range of low temperature UHV SPM | | MICRO Series | Devised to allow sample heating and or/ cooling during SPM operation | | PEEM MICROANALYSER | High resolution imaging, retractable entrance slit, micro-spot analysis | | CryoSXM | Low temperature positioning and scanning stage on non-magnetic | | MULTIPROBE MXPS® | Multi-technique surface analysis system solution for mono-XPS and UHV SPM | | CRYOGENIC SFM (head) | Operation at cryogenic temperature and in high magnetic fields | | VT Beam Deflection AFM | Optical beam deflection for AMF, variable temperature | | Focus IS-PEEM | Photoemission electronic microscope, synchrotron application | | FOCUS PEEM IEF | Photoemission microscope with imaging high pass energy filter | | FOCUS PEEM | Real-time photoemission electron microscope,energy filtering, microanalyser | | STM/SEM stage | STM/SEM-HC stage feature sample heating and cooling | | MULTIPROBE LT | Surface at cryogenic temperature, STM operation | | STM 1 | Ultimate STM resolution, optimum spectroscopy performance | | Variable Temperature UHV SPM | Variable UHV SPM, temperature range 25K to 1500K |
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