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Diffractometers
Diffractometers Data Sheets
Diffractometers are used to measure crystal structure, grain size, texture, and/or residual stress of materials and compounds through the interaction of X-ray beams, gamma rays, electron beams, or neutron beams with a sample.
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Diffractometers: Learn More
Diffractometers DataSheets From:
Headquarters
Agilent Technologies, Inc. / Life Sciences and Chemical Analysis
Santa Clara, CA
Bruker AXS, Inc.
Madison, WI
Bruker Nano Surfaces Division
Santa Barbara, CA
PANalytical, Inc.
Natick, MA
Rigaku Corporation
The Woodlands, TX
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View Datasheets by Spec
Benchtop
Camera / Film
Collimators and Slits
Eulerian Cradle
Goniometer
High Resolution / Crystal Quality
Imaging Plate/Foil
K-Beta Absorption Filter
Laue - Single Crystal
Measures Crystallite Size
Monochromating Crystal
Detector Type:Other
Sample/Detector Positioning System:Other
Other Method
Position Sensitive Detector (PSD)
Powder
Residual Stress Measurement
Scintillation
Single Crystal Orientation
Solid State / Semiconductor
Texture / Preferred Orientation
Translation Stage
X-Ray
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